"Statistical threshold formulation for dynamic I_dd test."

Wanli Jiang, Bapiraju Vinnakota (2002)

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DOI: 10.1109/TCAD.2002.1004313

access: closed

type: Journal Article

metadata version: 2020-09-24

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Wanli Jiang, Bapiraju Vinnakota:
Statistical threshold formulation for dynamic I_dd test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(6): 694-705 (2002)

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