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"Testing Ternary Content Addressable Memories With Comparison Faults Using ..."

Jin-Fu Li (2007)

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DOI: 10.1109/TCAD.2007.8361585

access: closed

type: Journal Article

metadata version: 2023-10-17

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Jin-Fu Li:
Testing Ternary Content Addressable Memories With Comparison Faults Using March-Like Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(5): 919-931 (2007)

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