"Magnifier: A Chiplet Feature-Aware Test Case Generation Method for Deep ..."

Boyu Li et al. (2025)

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DOI: 10.1109/TCAD.2025.3528358

access: closed

type: Journal Article

metadata version: 2025-08-09

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Boyu Li, Zongwei Zhu, Weihong Liu, Qianyue Cao, Changlong Li, Cheng Ji, Xi Li, Xuehai Zhou:
Magnifier: A Chiplet Feature-Aware Test Case Generation Method for Deep Learning Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(7): 2803-2816 (2025)

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