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"Test-point insertion: scan paths through functional logic."

Chih-Chang Lin et al. (1998)

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DOI: 10.1109/43.720319

access: closed

type: Journal Article

metadata version: 2022-12-07

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  - journals/tcad/LinMCL98
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Chih-Chang Lin, Malgorzata Marek-Sadowska, Kwang-Ting Cheng, Mike Tien-Chien Lee:
Test-point insertion: scan paths through functional logic. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(9): 838-851 (1998)

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