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"Verification of Nyquist data converters using behavioral simulation."

Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli (1995)

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DOI: 10.1109/43.372375

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/LiuS95
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  - https://dblp.org/rec/journals/tcad/LiuS95
Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli:
Verification of Nyquist data converters using behavioral simulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(4): 493-502 (1995)

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