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"Open faults in BiCMOS gates."

Siyad C. Ma, Edward J. McCluskey (1995)

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DOI: 10.1109/43.384417

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/MaM95
Siyad C. Ma, Edward J. McCluskey:
Open faults in BiCMOS gates. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(5): 567-575 (1995)

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