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"Simultaneous Generation of Functional and Low-Power Non-Functional ..."

Irith Pomeranz (2014)

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DOI: 10.1109/TCAD.2014.2314293

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Simultaneous Generation of Functional and Low-Power Non-Functional Broadside Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(8): 1245-1257 (2014)

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