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"A diagnostic test generation procedure based on test elimination byvector ..."
Irith Pomeranz, Sudhakar M. Reddy (2000)
- Irith Pomeranz, Sudhakar M. Reddy:
A diagnostic test generation procedure based on test elimination byvector omission for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(5): 589-600 (2000)
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