"A new approach to the simulation of the coupled point defects and impurity ..."

E. Rorris et al. (1990)

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DOI: 10.1109/43.62735

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type: Journal Article

metadata version: 2020-09-24

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E. Rorris, R. R. O'Brien, F. F. Morehead, R. F. Lever, J. P. Peng, G. R. Srinivasan:
A new approach to the simulation of the coupled point defects and impurity diffusion. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(10): 1113-1122 (1990)

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