"A Variability-Aware Adaptive Test Flow for Test Quality Improvement."

Michihiro Shintani et al. (2014)

> Home

Details and statistics

DOI: 10.1109/TCAD.2014.2305835

access: closed

type: Journal Article

metadata version: 2024-06-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/ShintaniUTHAMS14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/ShintaniUTHAMS14
Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, Takashi Sato:
A Variability-Aware Adaptive Test Flow for Test Quality Improvement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(7): 1056-1066 (2014)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.