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"On optimizing VLSI testing for product quality using die-yield prediction."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Adit D. Singh, C. Mani Krishna (1993)

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DOI: 10.1109/43.277614

access: closed

type: Journal Article

metadata version: 2022-09-10

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Adit D. Singh, C. Mani Krishna:
On optimizing VLSI testing for product quality using die-yield prediction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(5): 695-709 (1993)

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