"Defect level evaluation in an IC design environment."

José T. de Sousa et al. (1996)

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DOI: 10.1109/43.541448

access: closed

type: Journal Article

metadata version: 2022-10-05

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José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Cristoforo Marzocca, Francesco Corsi, Thomas W. Williams:
Defect level evaluation in an IC design environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(10): 1286-1293 (1996)

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