"A method for detecting interconnect DSM defects in systems on chip."

Shih-Yu Yang, Christos A. Papachristou (2006)

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DOI: 10.1109/TCAD.2005.853707

access: closed

type: Journal Article

metadata version: 2024-10-06

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Shih-Yu Yang, Christos A. Papachristou:
A method for detecting interconnect DSM defects in systems on chip. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(1): 197-204 (2006)

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