"Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit ..."

Jianlei Yang et al. (2016)

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DOI: 10.1109/TCAD.2015.2474366

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type: Journal Article

metadata version: 2022-07-04

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Jianlei Yang, Peiyuan Wang, Yaojun Zhang, Yuanqing Cheng, Weisheng Zhao, Yiran Chen, Hai (Helen) Li:
Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(3): 380-393 (2016)

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