"Importance Boundary Sampling for SRAM Yield Analysis With Multiple Failure ..."

Jian Yao, Zuochang Ye, Yan Wang (2014)

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DOI: 10.1109/TCAD.2013.2292504

access: closed

type: Journal Article

metadata version: 2020-09-24

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Jian Yao, Zuochang Ye, Yan Wang:
Importance Boundary Sampling for SRAM Yield Analysis With Multiple Failure Regions. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(3): 384-396 (2014)

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