"Error Diluting: Exploiting 3-D nand Flash Process Variation for Efficient ..."

Kong-Kiat Yong, Li-Pin Chang (2020)

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DOI: 10.1109/TCAD.2020.3012646

access: closed

type: Journal Article

metadata version: 2020-12-17

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Kong-Kiat Yong, Li-Pin Chang:
Error Diluting: Exploiting 3-D nand Flash Process Variation for Efficient Read on LDPC-Based SSDs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(11): 3467-3478 (2020)

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