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"Implementation of VLSI self-testing by regularization."

Y. You, John P. Hayes (1988)

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DOI: 10.1109/43.16804

access: closed

type: Journal Article

metadata version: 2020-09-24

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Y. You, John P. Hayes:
Implementation of VLSI self-testing by regularization. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(12): 1261-1271 (1988)

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