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"Expected Value and Variance of the Indirect Time-of-Flight Measurement ..."

Maik Beer et al. (2018)

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DOI: 10.1109/TCSI.2017.2752860

access: closed

type: Journal Article

metadata version: 2020-10-26

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Maik Beer, Olaf M. Schrey, Bedrich J. Hosticka, Rainer Kokozinski:
Expected Value and Variance of the Indirect Time-of-Flight Measurement With Dead Time Afflicted Single-Photon Avalanche Diodes. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(3): 970-981 (2018)

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