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"Accurate and Fast On-Wafer Test Circuitry for Device Array ..."

Hao-Chiao Hong, Long-Yi Lin (2019)

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DOI: 10.1109/TCSI.2019.2924251

access: closed

type: Journal Article

metadata version: 2020-05-22

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Hao-Chiao Hong, Long-Yi Lin:
Accurate and Fast On-Wafer Test Circuitry for Device Array Characterization in Wafer Acceptance Test. IEEE Trans. Circuits Syst. I Regul. Pap. 66-I(9): 3467-3479 (2019)

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