"A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm ..."

Yan Li et al. (2020)

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DOI: 10.1109/TCSII.2020.3013338

access: closed

type: Journal Article

metadata version: 2021-07-29

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Yan Li, Xu Cheng, Chiyu Tan, Jun Han, Yuanfu Zhao, Liang Wang, Tongde Li, Mehdi B. Tahoori, Xiaoyang Zeng:
A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application. IEEE Trans. Circuits Syst. II Express Briefs 67-II(9): 1619-1623 (2020)

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