"Statistical Characterization of Noise and Interference in NAND Flash Memory."

Jaekyun Moon et al. (2013)

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DOI: 10.1109/TCSI.2013.2239116

access: closed

type: Journal Article

metadata version: 2020-05-22

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Jaekyun Moon, Jaehyeong No, Sangchul Lee, Sangsik Kim, Seokhwan Choi, Yunheub Song:
Statistical Characterization of Noise and Interference in NAND Flash Memory. IEEE Trans. Circuits Syst. I Regul. Pap. 60-I(8): 2153-2164 (2013)

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