"System-level test and yield improvement for optoelectronic-VLSI chips."

Jean-Philippe Thibodeau, Michael B. Venditti, David V. Plant (2005)

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DOI: 10.1109/TCSII.2005.852531

access: closed

type: Journal Article

metadata version: 2020-05-27

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Jean-Philippe Thibodeau, Michael B. Venditti, David V. Plant:
System-level test and yield improvement for optoelectronic-VLSI chips. IEEE Trans. Circuits Syst. II Express Briefs 52-II(11): 794-797 (2005)

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