"Modeling of CMOS Integrated Strain Sensors and Sensitivity Enhanced ..."

Kim Allinger, Andreas Bahr, Matthias Kuhl (2024)

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DOI: 10.1109/TCSI.2023.3339224

access: closed

type: Journal Article

metadata version: 2024-02-29

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Kim Allinger, Andreas Bahr, Matthias Kuhl:
Modeling of CMOS Integrated Strain Sensors and Sensitivity Enhanced Readout Architecture. IEEE Trans. Circuits Syst. I Regul. Pap. 71(2): 583-594 (2024)

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