"An Analytical MOS Device Model With Mismatch and Temperature Variation for ..."

Ben Varkey Benjamin, Richelle L. Smith, Kwabena A. Boahen (2023)

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DOI: 10.1109/TCSII.2023.3234009

access: closed

type: Journal Article

metadata version: 2025-07-04

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Ben Varkey Benjamin, Richelle L. Smith, Kwabena A. Boahen:
An Analytical MOS Device Model With Mismatch and Temperature Variation for Subthreshold Circuits. IEEE Trans. Circuits Syst. II Express Briefs 70(6): 1826-1830 (2023)

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