"Characterizations of locally testable linear- and affine-invariant families."

Angsheng Li, Yicheng Pan (2012)

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DOI: 10.1016/J.TCS.2011.09.030

access: open

type: Journal Article

metadata version: 2022-04-06

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Angsheng Li, Yicheng Pan:
Characterizations of locally testable linear- and affine-invariant families. Theor. Comput. Sci. 414(1): 55-75 (2012)

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