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"A Large-Scale Empirical Study on the Vulnerability of Deployed IoT Devices."
Binbin Zhao et al. (2022)
- Binbin Zhao, Shouling Ji, Wei-Han Lee, Changting Lin, Haiqin Weng, Jingzheng Wu, Pan Zhou, Liming Fang, Raheem Beyah:
A Large-Scale Empirical Study on the Vulnerability of Deployed IoT Devices. IEEE Trans. Dependable Secur. Comput. 19(3): 1826-1840 (2022)
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