"Design and Analysis of Accelerated Tests for Mission-Critical Reliability."

Yu Ding (2005)

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DOI: 10.1198/TECH.2005.S268

access: closed

type: Journal Article

metadata version: 2017-12-21

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Yu Ding:
Design and Analysis of Accelerated Tests for Mission-Critical Reliability. Technometrics 47(2): 240 (2005)

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