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"Accelerated Destructive Degradation Test Planning."

Ying Shi, Luis A. Escobar, William Q. Meeker (2009)

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DOI: 10.1198/TECH.2009.0001

access: closed

type: Journal Article

metadata version: 2017-05-27

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  - https://dblp.org/rec/journals/technometrics/ShiEM09
Ying Shi, Luis A. Escobar, William Q. Meeker:
Accelerated Destructive Degradation Test Planning. Technometrics 51(1): 1-13 (2009)

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