"Feature Detection and Hypothesis Testing for Extremely Noisy Nanoparticle ..."

Andrew M. Thomas et al. (2023)

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DOI: 10.1080/00401706.2023.2203744

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type: Journal Article

metadata version: 2025-01-19

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Andrew M. Thomas, Peter A. Crozier, Yuchen Xu, David S. Matteson:
Feature Detection and Hypothesis Testing for Extremely Noisy Nanoparticle Images using Topological Data Analysis. Technometrics 65(4): 590-603 (2023)

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