"Structural Test Coverage Criteria for Deep Neural Networks."

Youcheng Sun et al. (2019)

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DOI: 10.1145/3358233

access: closed

type: Journal Article

metadata version: 2020-10-26

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Youcheng Sun, Xiaowei Huang, Daniel Kroening, James Sharp, Matthew Hill, Rob Ashmore:
Structural Test Coverage Criteria for Deep Neural Networks. ACM Trans. Embed. Comput. Syst. 18(5s): 94:1-94:23 (2019)

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