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"First Tests of a New Facility for Device-Level, Board-Level and ..."

Carlo Cazzaniga et al. (2021)

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DOI: 10.1109/TETC.2018.2879027

access: closed

type: Journal Article

metadata version: 2021-04-07

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Carlo Cazzaniga, Marta Bagatin, Simone Gerardin, Alessandra Costantino, Christopher D. Frost:
First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics. IEEE Trans. Emerg. Top. Comput. 9(1): 104-108 (2021)

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