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"A Statistical Gate Sizing Method for Timing Yield and Lifetime Reliability ..."
Seyed Milad Ebrahimipour, Behnam Ghavami, Mohsen Raji (2021)
- Seyed Milad Ebrahimipour, Behnam Ghavami
, Mohsen Raji
:
A Statistical Gate Sizing Method for Timing Yield and Lifetime Reliability Optimization of Integrated Circuits. IEEE Trans. Emerg. Top. Comput. 9(2): 759-773 (2021)
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