"Reliability Assessment of Double-Sided Linear Switched Reluctance ..."

Hao Chen et al. (2019)

> Home

Details and statistics

DOI: 10.1109/TIE.2018.2851978

access: closed

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tie/ChenXWYN19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tie/ChenXWYN19
Hao Chen, Shuai Xu, Wenkai Wei, Jian Yang, Rui Nie:
Reliability Assessment of Double-Sided Linear Switched Reluctance Generator System Based on Hierarchical Markov Model. IEEE Trans. Ind. Electron. 66(6): 4901-4911 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.