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"Diagnostics and Prognostics Method for Analog Electronic Circuits."

Arvind Sai Sarathi Vasan, Bing Long, Michael G. Pecht (2013)

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DOI: 10.1109/TIE.2012.2224074

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/tie/VasanLP13
Arvind Sai Sarathi Vasan, Bing Long, Michael G. Pecht:
Diagnostics and Prognostics Method for Analog Electronic Circuits. IEEE Trans. Ind. Electron. 60(11): 5277-5291 (2013)

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