Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Weakly Supervised End-to-End Learning for Inspection on Multidirectional ..."

Zhongshu Chen et al. (2024)

> Home

Details and statistics

DOI: 10.1109/TII.2023.3301065

access: closed

type: Journal Article

metadata version: 2024-03-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tii/ChenZGZL24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tii/ChenZGZL24
Zhongshu Chen, Lin Zuo, Feng Guo, Changhua Zhang, Yu Liu:
Weakly Supervised End-to-End Learning for Inspection on Multidirectional Integrated Circuit Markings in Surface Mount Technology. IEEE Trans. Ind. Informatics 20(3): 3133-3143 (2024)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.