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"Deep Learning for In Situ and Real-Time Quality Monitoring in Additive ..."

Sergey A. Shevchik et al. (2019)

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DOI: 10.1109/TII.2019.2910524

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/tii/ShevchikMKLW19
Sergey A. Shevchik, Giulio Masinelli, Christoph Kenel, Christian Leinenbach, Kilian Wasmer:
Deep Learning for In Situ and Real-Time Quality Monitoring in Additive Manufacturing Using Acoustic Emission. IEEE Trans. Ind. Informatics 15(9): 5194-5203 (2019)

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