"Reproducibility of transmission line measurement of bipolar I-V ..."

T. P. Chen et al. (1999)

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DOI: 10.1109/19.772206

access: closed

type: Journal Article

metadata version: 2020-06-08

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T. P. Chen, R. Chan, S. Fung, K. F. Lo:
Reproducibility of transmission line measurement of bipolar I-V characteristics of MOSFETs. IEEE Trans. Instrum. Meas. 48(3): 721-723 (1999)

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