"Nonlinear Analysis of Electroencephalogram Variability as a Measure of the ..."

Yi-Feng Chen et al. (2022)

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DOI: 10.1109/TIM.2022.3167793

access: closed

type: Journal Article

metadata version: 2025-11-02

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Yi-Feng Chen, Shou-Zen Fan, Maysam F. Abbod, Jiann-Shing Shieh, Mingming Zhang:
Nonlinear Analysis of Electroencephalogram Variability as a Measure of the Depth of Anesthesia. IEEE Trans. Instrum. Meas. 71: 1-13 (2022)

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