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"Intrinsic sensitivity of Cd1-xZnxTe semiconductors ..."

George C. Giakos et al. (2003)

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DOI: 10.1109/TIM.2003.818563

access: closed

type: Journal Article

metadata version: 2020-12-31

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  - https://dblp.org/rec/journals/tim/GiakosGASVSCPSMEOKUM03
George C. Giakos, R. Guntupalli, J. Alexis De Abreu Garcia, N. Shah, Srinivasan Vedantham, Sankararaman Suryanarayanan, Samir Chowdhury, N. Patnekar, S. Sumrain, K. Mehta, Edward A. Evans, A. Orozco, V. Kumar, Okechukwu C. Ugweje, A. Moholkar:
Intrinsic sensitivity of Cd_1-xZn_xTe semiconductors for digital radiographic imaging. IEEE Trans. Instrum. Meas. 52(5): 1559-1565 (2003)

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