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"Testing of Precision DAC Using Low-Resolution ADC With Wobbling."

Le Jin et al. (2008)

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DOI: 10.1109/TIM.2007.911694

access: closed

type: Journal Article

metadata version: 2022-07-26

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Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DAC Using Low-Resolution ADC With Wobbling. IEEE Trans. Instrum. Meas. 57(5): 940-946 (2008)

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