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ORCIDDegang Chen 0001
D. J. Chen 0001
Person information
- affiliation: Iowa State University, Department of Electrical and Computer Engineering, Ames, IA, USA
- affiliation (PhD 1992): University of California, Santa Barbara, CA, USA
Other persons with the same name
- Degang Chen 0002
![[0000-0002-1135-9807]](https://dblp.org/img/orcid-mark.12x12.png "0000-0002-1135-9807")
(aka: De-Gang Chen 0002, De-gang Chen 0002) — North China Electric Power University, Department of Mathematics and Physics, Beijing, China (and 5 more) - Degang Chen 0003 — University of Electronic Science and Technology of China, School of Computer Science and Engineering, Chengdu, China
- Degang Chen 0004 — Xinjiang Normal University, College of Computer Science and Technology, Urumqi, China
- Degang Chen 0005 — Henan Normal University, College of Computer and Information Engineering, Xinxiang, China
- D. J. Chen 0002 — National Chiao Tung University, Department of Computer Science and Information Engineering, Hsin Chu, Taiwan
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2020 – today
- 2024
[j54]Kushagra Bhatheja, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen:
A BIST Approach to Approximate Co-Testing of Embedded Data Converters. IEEE Des. Test 41(3): 21-28 (2024)- [c178]Ekaniyere Oko-Odion, Isaac Bruce, Emmanuel Nti Darko, Michael Sekyere, Degang Chen:
Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm. ISVLSI 2024: 27-32 - [c177]Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Matthew Crabb, Degang Chen:
A 3-Segment Interpolating String DAC with Low-Cost Built-In-Self-Test Capabilities. ISVLSI 2024: 708-711 - [c176]Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen:
Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm. MWSCAS 2024: 571-575 - [c175]Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger:
Novel Single-Temperature Trim Techniques for Bandgap Voltage References. MWSCAS 2024: 683-687 - [c174]Saeid Karimpour, Isaac Bruce, Michael Sekyere, Ruohan Yang, Emmanuel Nti Darko, Degang Chen:
A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs. MWSCAS 2024: 1051-1055 - [c173]Michael Sekyere, Degang Chen:
Invited Paper: Low Power, Fully-Integrated Flipped Voltage Follower LDO Using Off-State Non-Linear Circuits for Enhanced Transient Performance. MWSCAS 2024: 9347-9351 - 2023
- [j53]Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction. IEEE Des. Test 40(5): 52-61 (2023) - [j52]Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. J. Electron. Test. 39(1): 57-69 (2023) - [c172]Vijayalakshmi Naganadhan, Marampally Saikiran, Mahmoud Gshash, Degang Chen:
Systematic Methodology to Design High Precision Voltage References with Sub-ppm/°C Temperature Coefficient. EWDTS 2023: 1-11 - [c171]Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen:
Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview. EWDTS 2023: 1-5 - [c170]Marampally Saikiran, Michael Sekyere, Mona Ganji, Degang Chen:
Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency. EWDTS 2023: 1-6 - [c169]Michael Sekyere, Marampally Saikiran, Degang Chen:
A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers. EWDTS 2023: 1-6 - [c168]Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger:
A Resistorless Precision Curvature-Compensated Bandgap Voltage Reference Based on the VGO Extraction Technique. ISCAS 2023: 1-5 - [c167]Bryce Gadogbe, Daniel Adjei, Kwabena Oppong Banahene, Randall L. Geiger, Degang Chen:
Sub-ppm/°C High Performance Voltage Reference. ISCAS 2023: 1-4 - [c166]Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger, Shravan K. Chaganti, Dhyey Desai, Jerry Doorenbos, Jim Todsen:
An Improved Single-Temperature Trim Technique for 1st Order-Compensated Bandgap References. MWSCAS 2023: 59-63 - [c165]Bryce Gadogbe, Ruohang Yang, Kwabena Oppong Banahene, Pallavi Ebenezer, Randall L. Geiger, Degang Chen:
Very Compact Temperature Sensor for Power/Thermal Management. MWSCAS 2023: 142-146 - [c164]Isaac Bruce, Michael Sekyere, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen:
Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm. MWSCAS 2023: 477-481 - [c163]Ruohan Yang, Bryce Gadogbe, Randall L. Geiger, Degang Chen:
A Compact and Accurate MOS-based Temperature Sensor for Thermal Management. MWSCAS 2023: 594-598 - [c162]Michael Sekyere, Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen:
Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm. MWSCAS 2023: 604-608 - [c161]Kushagra Bhatheja, Degang Chen:
An Architectural Framework for On-Line Health Monitoring of Integrated Circuits. MWSCAS 2023: 850-854 - 2022
- [j51]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. J. Electron. Test. 38(6): 637-651 (2022) - [c160]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. DFT 2022: 1-6 - [c159]Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Graph Theory Approach for Multi-site ATE Board Parameter Extraction. ETS 2022: 1-2 - [c158]Michael Sekyere, Marampally Saikiran, Degang Chen:
All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage. IOLTS 2022: 1-5 - [c157]Mona Ganji, Marampally Saikiran, Degang Chen:
A Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models. ISCAS 2022: 605-609 - [c156]Kwabena Oppong Banahene, Matthew R. Strong, Bryce Gadogbe, Degang Chen, Randall L. Geiger:
Hardware Security Vulnerability in Analog Signal Chain Filters. ISCAS 2022: 667-671 - [c155]Kushagra Bhatheja, Matthew R. Strong, Degang Chen:
Level Shifters for Charge Constrained Applications. ISCAS 2022: 1203-1204 - [c154]Marampally Saikiran, Mona Ganji, Degang Chen:
Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection. ISCAS 2022: 1580-1584 - [c153]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. ITC 2022: 509-513 - [c152]Kushagra Bhatheja, Shravan K. Chaganti, Degang Chen, Xiankun Robert Jin, Chris C. Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R. Knight, Allan Dobbin, Scott W. Herrin, Doug Garrity:
Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing. ITC 2022: 514-518 - [c151]Marampally Saikiran, Mona Ganji, Degang Chen:
A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits. SBCCI 2022: 1-6 - [c150]Marampally Saikiran, Mona Ganji, Degang Chen:
Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators. SBCCI 2022: 1-6 - [c149]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. VTS 2022: 1-7 - [c148]Mona Ganji, Marampally Saikiran, Degang Chen:
All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis. VTS 2022: 1-7 - 2021
- [j50]Nanqi Liu, Randall L. Geiger, Degang Chen:
Sub-ppm/°C Bandgap References With Natural Basis Expansion for Curvature Cancellation. IEEE Trans. Circuits Syst. I Regul. Pap. 68(9): 3551-3561 (2021) - [j49]Kushagra Bhatheja, Xiankun Jin, Matthew R. Strong, Degang Chen:
Fast Gate Leakage Current Monitor With Large Dynamic Range. IEEE Trans. Circuits Syst. II Express Briefs 68(5): 1690-1694 (2021) - [j48]Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing. IEEE Trans. Instrum. Meas. 70: 1-12 (2021) - [c147]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. DTIS 2021: 1-6 - [c146]Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. ETS 2021: 1-4 - [c145]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. ITC 2021: 304-308 - [c144]Matthew R. Strong, Kushagra Bhatheja, Ruohan Yang, Degang Chen:
A Simple Monitor for Tracking NBTI in Integrated Systems. MWSCAS 2021: 1112-1115 - 2020
- [j47]Nanqi Liu, Jim Todsen, Degang Chen:
An 8-bit Low-Cost String DAC With Gradient Errors Suppression to Achieve 16-bit Linearity. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(7): 2157-2168 (2020) - [j46]Nanqi Liu, Degang Chen:
A Transient-Enhanced Output-Capacitorless LDO With Fast Local Loop and Overshoot Detection. IEEE Trans. Circuits Syst. 67-I(10): 3422-3432 (2020) - [j45]Chulhyun Park, Tao Chen, Kyoohyun Noh, Dadian Zhou, Suraj Prakash, Mohammadhossein Naderi Alizadeh, Aydin I. Karsilayan, Degang Chen, Randall L. Geiger, José Silva-Martínez:
A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier. IEEE Trans. Circuits Syst. 67-I(11): 3618-3629 (2020) - [j44]Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen:
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. IEEE Trans. Instrum. Meas. 69(3): 729-738 (2020) - [j43]Tao Chen, Chulhyun Park, Hao Meng, Dadian Zhou, José Silva-Martínez, Randall L. Geiger, Degang Chen:
A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test. IEEE Trans. Instrum. Meas. 69(6): 3516-3526 (2020) - [j42]Minshun Wu, Cheng Ban, Jiangtao Xu, Li Geng, Degang Chen:
MIRE: A Multitone Identification and Replacement Method for Multitone Spectral Test Without Requiring Coherent Sampling. IEEE Trans. Instrum. Meas. 69(7): 4578-4591 (2020) - [c143]Pangzhou Li, Nanqi Liu, Degang Chen:
A Simple Bandgap Reference Based on VGO Extraction with Single-Temperature Trimming. ISCAS 2020: 1-5 - [c142]Nanqi Liu, Jim Todsen, Degang Chen:
A Low-Power and Area-Efficient Analog Duty Cycle Corrector for ADC's External Clocks. ISCAS 2020: 1-4 - [c141]Marampally Saikiran, Mona Ganji, Degang Chen:
Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage. ITC 2020: 1-10 - [c140]Pallavi Sugantha Ebenezer, Vijayalakshmi Naganadhan, Degang Chen, Randall L. Geiger:
Three-Junction Bandgap Circuit with Sub 1 ppm/°C Temperature Coefficient. MWSCAS 2020: 305-308 - [c139]Kushagra Bhatheja, Srikanth Jagannathan, Degang Chen:
Least Square Based Jitter Decomposition Algorithm for a PAM4 link. MWSCAS 2020: 970-973 - [c138]Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing. VTS 2020: 1-6
2010 – 2019
- 2019
- [j41]You Li, Degang Chen:
Low-Cost, High-Precision DAC Design Based on Ordered Element Matching. IEEE Trans. Circuits Syst. I Regul. Pap. 66-I(2): 502-512 (2019) - [c137]Nanqi Liu, Randy Geiger, Degang Chen:
Bandgap Voltage VGO Extraction with Two-Temperature Trimming for Designing Sub-ppm/°C Voltage References. ISCAS 2019: 1-4 - [c136]Tao Chen, Degang Chen:
Built-in self-test and self-calibration for analog and mixed signal circuits. ITC 2019: 1-8 - [c135]Pallavi Ebenezer, Tyler Archer, Degang Chen, Randall L. Geiger:
A Precision Bandgap Voltage Reference Using Curvature Elimination Technique. MWSCAS 2019: 505-508 - [c134]Cheng Ban, Minshun Wu, Jiangtao Xu, Li Geng, Degang Chen:
An Accurate and Efficient Method for Eliminating the Requirement of Coherent Sampling in Multi-Tone Test. VTS 2019: 1-6 - 2018
- [j40]Zhiqiang Liu, Shravan K. Chaganti, Degang Chen:
Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(5): 1664-1674 (2018) - [j39]Tao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen:
USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(7): 2059-2069 (2018) - [j38]Yuming Zhuang, Benjamin Magstadt, Tao Chen, Degang Chen:
High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing. IEEE Trans. Instrum. Meas. 67(2): 279-287 (2018) - [c133]Shravan K. Chaganti, Tao Chen, Yuming Zhuang, Degang Chen:
Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME). I2MTC 2018: 1-6 - [c132]Yuming Zhuang, Degang Chen:
Cost-effective accurate DAC-ADC co-testing and DAC linearization. I2MTC 2018: 1-6 - [c131]Shravan K. Chaganti, Li Xu, Degang Chen:
A low-cost jitter separation and ADC spectral testing method without requiring coherent sampling. ISCAS 2018: 1-5 - [c130]Nanqi Liu, Shravan K. Chaganti, Zhiqiang Liu, Degang Chen, Amitava Majumdar:
Concurrent Sampling with Local Digitization - An Alternative to Analog Test Bus. ISCAS 2018: 1-5 - [c129]Nanqi Liu, Brian Johnson, Vinay Nadig, Degang Chen:
A Transient-Enhanced Fully-Integrated LDO Regulator for SoC Application. ISCAS 2018: 1-5 - [c128]Hao Meng, Randall L. Geiger, Degang Chen:
A High Constancy Rail-to-rail Level Shift Generator for SEIR-based BIST circuit for ADCs. ISCAS 2018: 1-5 - [c127]Qianqian Wang, Degang Chen, Randall L. Geiger:
Transparent side channel trigger mechanism on analog circuits with PAAST hardware Trojans. ISCAS 2018: 1-4 - [c126]Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen:
Fast and accurate linearity test for DACs with various architectures using segmented models. ITC 2018: 1-10 - [c125]Yuming Zhuang, Degang Chen:
Accurate Spectral Testing with Impure Test Stimulus for Multi-tone Test. ITC-Asia 2018: 97-102 - [c124]Yuming Zhuang, Degang Chen:
Cost-Effective High Purity Signal Generator Using Pre-distortion. ITC-Asia 2018: 103-108 - 2017
- [j37]Yuming Zhuang, Degang Chen:
ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling. J. Electron. Test. 33(3): 305-313 (2017) - [j36]Yan Duan, Tao Chen, Degang Chen:
A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm. J. Electron. Test. 33(6): 709-720 (2017) - [j35]You Li, Zhiqiang Liu, Degang Chen:
Efficient Verification Against Undesired Operating Points for MOS Analog Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 64-I(8): 2134-2145 (2017) - [j34]Yuming Zhuang, Degang Chen:
Accurate Spectral Testing With Non-Coherent Sampling for Multi-Tone Test. IEEE Trans. Circuits Syst. II Express Briefs 64-II(12): 1357-1361 (2017) - [j33]Yuming Zhuang, Li Xu, Degang Chen:
Accurate Spectral Testing With Arbitrary Noncoherency in Sampling and Simultaneous Drifts in Amplitude and Frequency. IEEE Trans. Instrum. Meas. 66(5): 1002-1012 (2017) - [j32]Yuming Zhuang, Degang Chen:
Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Noncoherency and Large Distortion. IEEE Trans. Instrum. Meas. 66(10): 2556-2565 (2017) - [c123]Zhiqiang Liu, Degang Chen:
A voltage reference generator targeted at extracting the silicon bandgap Vgo from Vbe. ISCAS 2017: 1-4 - [c122]Zhiqiang Liu, Nanqi Liu, Shravan K. Chaganti, Degang Chen, Amitava Majumdar:
A digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection. ISCAS 2017: 1-4 - [c121]Yuming Zhuang, Degang Chen:
Accurate spectral testing of the signals with amplitude drift. ISCAS 2017: 1-4 - [c120]Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen:
An on-chip ADC BIST solution and the BIST enabled calibration scheme. ITC 2017: 1-10 - [c119]Li Xu, Yuming Zhuang, Rajavelu Thinakaran, Kenneth M. Butler, Degang Chen:
Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter. ITC 2017: 1-10 - [c118]Yuming Zhuang, Degang Chen:
Accurate and robust spectral testing with relaxed instrumentation requirements. ITC 2017: 1-10 - [c117]Nanqi Liu, Chris Lash, Jim Todsen, Degang Chen:
Systematic and random mismatch characterization in device arrays. MWSCAS 2017: 595-598 - [c116]Nanqi Liu, Chris Lash, Jim Todsen, Degang Chen:
Practical linear and quadratic gradient errors suppression techniques in string DACs. MWSCAS 2017: 1176-1179 - [c115]Qianqian Wang, Degang Chen, Randall L. Geiger:
Technique for generating timing skew resistant time-interleaved signals. MWSCAS 2017: 1561-1564 - [c114]Shravan K. Chaganti, Li Xu, Degang Chen:
A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter. VTS 2017: 1-6 - [c113]Yan Duan, Degang Chen:
Accurate jitter decomposition in high-speed links. VTS 2017: 1-6 - 2016
- [j31]Yuming Zhuang, Degang Chen:
New Strategies in Removing Noncoherency From Signals With Large Distortion-to-Noise Ratios. IEEE Trans. Circuits Syst. II Express Briefs 63-II(12): 1136-1140 (2016) - [j30]Benjamin Magstadt, Yuming Zhuang, Degang Chen:
Accurate Spectral Testing With Impure Source and Noncoherent Sampling. IEEE Trans. Instrum. Meas. 65(11): 2454-2463 (2016) - [c112]Zhiqiang Liu, Shravan K. Chaganti, Degang Chen:
Toward complete analog fault coverage with minimal observation points using a fault propagation graph. ISCAS 2016: 1282-1285 - [c111]Yan Duan, Tao Chen, Degang Chen:
Low-cost dithering generator for accurate ADC linearity test. ISCAS 2016: 1474-1477 - [c110]Yuming Zhuang, Degang Chen:
New strategies in removing non-coherency from signals with large distortion to noise ratios. ISCAS 2016: 2901 - [c109]Yuming Zhuang, Akhilesh Kesavan Unnithan, Arun Joseph, Siva Sudani, Benjamin Magstadt, Degang Chen:
Low cost ultra-pure sine wave generation with self calibration. ITC 2016: 1-9 - [c108]Yuming Zhuang, Degang Chen:
Accurate spectral testing with non-coherent sampling for large distortion to noise ratios. VTS 2016: 1-6 - [c107]Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen:
Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise. VTS 2016: 1-6 - 2015
- [j29]Siva Kumar Sudani, Li Xu, Degang Chen:
A Comparative Study of State-of-the-Art High-Performance Spectral Test Methods. IEEE Des. Test 32(1): 26-35 (2015) - [j28]Minshun Wu, Zhiqiang Liu, Degang Chen:
Extracting random jitter and sinusoidal jitter in ADC output with a single frequency test. IEICE Electron. Express 12(20): 20150742 (2015) - [c106]You Li, Degang Chen:
A novel 20-bit R-2R DAC structure based on ordered element matching. ISCAS 2015: 1030-1033 - [c105]Yen-Ting Wang, Chen Zhao, Degang Chen, Randall L. Geiger:
Direct temperature to digital converters with low supply sensitivity for power/thermal management. ISCAS 2015: 1066-1069 - [c104]Qianqian Wang, Randall L. Geiger, Degang Chen:
A programmable temperature trigger circuit. ISCAS 2015: 1070-1073 - [c103]Xu Zhang, Chongli Cai, Degang Chen, Gregory Blum:
Cascode and transconductance with capacitances feedback compensation for multistage amplifiers driving no load and 1nF capacitive load. ISCAS 2015: 2077-2080 - [c102]Xu Zhang, Degang Chen:
An integrated circuit solution of thermal noise thermometer with cascaded pre-amplifier and 6-bit resolution analog-to-digital converter. ISCAS 2015: 2221-2224 - [c101]Li Xu, Degang Chen:
Accurate spectral testing of analog-to-digital converters with frequency drift using phase correction and averaging. ISCAS 2015: 2265-2268 - [c100]Li Xu, Degang Chen:
A low cost jitter estimation and ADC spectral testing method. ISCAS 2015: 2277-2280 - [c99]Yan Duan, Tao Chen, Zhiqiang Liu, Xu Zhang, Degang Chen:
High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST. ISCAS 2015: 3016-3019 - [c98]Chongli Cai, Degang Chen:
Performance enhancement induced Trojan states in op-amps, their detection and removal. ISCAS 2015: 3020-3023 - [c97]Xu Zhang, Chongli Cai, Hao Meng, Siva Sudani, Randall L. Geiger, Degang Chen:
A calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit. ISCAS 2015: 3024-3027 - [c96]Chongli Cai, Degang Chen:
A slew-rate enhancement technique for fully differential amplifier without inducing Trojan state. MWSCAS 2015: 1-4 - [c95]Xing Cao, Qianqian Wang, Randall L. Geiger, Degang Chen:
A hardware Trojan embedded in the Inverse Widlar reference generator. MWSCAS 2015: 1-4 - [c94]Jiaming Liu, Hao Meng, Degang Chen:
Switched-compensation technique in switched-capacitor circuit for achieving fast settling performance. MWSCAS 2015: 1-4 - [c93]Hao Meng, Degang Chen:
A simple ramp generator with level spreading for SEIR based ADC BIST circuit. MWSCAS 2015: 1-4 - [c92]Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen:
Effect of flicker noise on SEIR for accurate ADC linearity testing. MWSCAS 2015: 1-4 - [c91]Tao Chen, Degang Chen:
Ultrafast stimulus error removal algorithm for ADC linearity test. VTS 2015: 1-5 - [c90]Li Xu, Yan Duan, Degang Chen:
A low cost jitter separation and characterization method. VTS 2015: 1-5 - 2014
- [j27]Li Xu, Siva Kumar Sudani, Degang Chen:
Efficient Spectral Testing With Clipped and Noncoherently Sampled Data. IEEE Trans. Instrum. Meas. 63(6): 1451-1460 (2014) - [c89]Bin Huang, Degang Chen:
A high gain operational amplifier via an efficient conductance cancellation technique. CICC 2014: 1-4 - [c88]You Li, Degang Chen:
Efficient analog verification against Trojan states using divide and contraction method. ISCAS 2014: 281-284 - [c87]Zhiqiang Liu, You Li, Yan Duan, Randall L. Geiger, Degang Chen:
Identification and break of positive feedback loops in Trojan States Vulnerable Circuits. ISCAS 2014: 289-292 - [c86]Li Xu, Degang Chen:
Fast co-test of linearity and spectral performance with non-coherent sampled and amplitude clipped data. ITC 2014: 1-8 - [c85]Bin Huang, Degang Chen:
An effective conductance cancellation method with minimal design effort. MWSCAS 2014: 258-261 - [c84]Bin Huang, Degang Chen:
A simple slew rate enhancement technique with improved linearity and preserved small signal performance. MWSCAS 2014: 270-273 - [c83]Qianqian Wang, Randall L. Geiger, Degang Chen:
Challenges and opportunities for determining presence of multiple equilibrium points with circuit simulators. MWSCAS 2014: 406-409 - [c82]Yen-Ting Wang, Degang Chen, Randall L. Geiger:
A CMOS supply-insensitive with 13ppm/°C temperature coefficient current reference. MWSCAS 2014: 475-478 - [c81]Zhiqiang Liu, You Li, Randall L. Geiger, Degang Chen:
Auto-identification of positive feedback loops in multi-state vulnerable circuits. VTS 2014: 1-5 - [c80]Li Xu, Degang Chen:
Accurate and efficient method of jitter and noise separation and its application to ADC testing. VTS 2014: 1-5 - 2013
- [j26]Tao Zeng, Degang Chen:
An Order-Statistics Based Matching Strategy for Circuit Components in Data Converters. IEEE Trans. Circuits Syst. I Regul. Pap. 60-I(1): 11-24 (2013) - [j25]Bharath Karthik Vasan, Siva Kumar Sudani, Degang Chen, Randall L. Geiger:
Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique. IEEE Trans. Circuits Syst. I Regul. Pap. 60-I(5): 1122-1134 (2013) - [j24]Siva Kumar Sudani, Degang Chen:
FIRE: A Fundamental Identification and Replacement Method for Accurate Spectral Test Without Requiring Coherency. IEEE Trans. Instrum. Meas. 62(11): 3015-3025 (2013) - [c79]Tao Zeng, Kevin Townsend, Jingbo Duan, Degang Chen:
A 15-bit binary-weighted current-steering DAC with ordered element matching. CICC 2013: 1-4 - [c78]Li Xu, Degang Chen:
ADC spectral testing allowing amplitude clipping. I2MTC 2013: 1526-1529 - [c77]Srijita Patra, Degang Chen, Randy Geiger:
Reliability degradation with electrical, thermal and thermal gradient stress in interconnects. ISCAS 2013: 1063-1066 - [c76]You Li, Tao Zeng, Degang Chen:
A high resolution and high accuracy R-2R DAC based on ordered element matching. ISCAS 2013: 1974-1977 - [c75]Chen Zhao, Yen-Ting Wang, David Genzer, Degang Chen, Randall L. Geiger:
A CMOS on-chip temperature sensor with -0.21°C 0.17 °C inaccuracy from -20 °C to 100 °C. ISCAS 2013: 2621-2625 - [c74]Yen-Ting Wang, Degang Chen, Randall L. Geiger:
Practical methods for verifying removal of Trojan stable operating points. ISCAS 2013: 2658-2661 - [c73]Siva Sudani, Degang Chen, Randall L. Geiger:
High resolution ADC spectral test with known impure source and non-coherent sampling. ISCAS 2013: 2674-2677 - [c72]Degang Chen, Zhongjun Yu, Krunal Maniar, Mojtaba Nowrozi:
Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations. ITC 2013: 1-9 - [c71]Siva Sudani, Li Xu, Degang Chen:
Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping. ITC 2013: 1-10 - [c70]Yen-Ting Wang, Degang Chen, Randall L. Geiger:
Effectiveness of circuit-level continuation methods for Trojan State Elimination verification. MWSCAS 2013: 1043-1046 - 2012
- [j23]Jingbo Duan, Bharath K. Vasan, Chen Zhao, Degang Chen, Randall L. Geiger:
On Chip Signal Generators for Low Overhead ADC BIST. J. Electron. Test. 28(5): 615-623 (2012) - [j22]Minshun Wu, Degang Chen, Jingbo Duan:
An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency. J. Electron. Test. 28(5): 733-743 (2012) - [j21]Minshun Wu, Guican Chen, Degang Chen:
ADC jitter estimation using a single frequency test without requiring coherent sampling. IEICE Electron. Express 9(18): 1485-1491 (2012) - [j20]Minshun Wu, Degang Chen, Guican Chen:
New Spectral Leakage-Removing Method for Spectral Testing of Approximate Sinusoidal Signals. IEEE Trans. Instrum. Meas. 61(5): 1296-1306 (2012) - [j19]Jingbo Duan, Le Jin, Degang Chen:
Testing ADC Spectral Performance Without Dedicated Data Acquisition. IEEE Trans. Instrum. Meas. 61(11): 2941-2952 (2012) - [c69]Jingbo Duan, Degang Chen, Randall L. Geiger:
A low cost method for testing offset and gain error for ADC BIST. ISCAS 2012: 2023-2026 - [c68]Bharath K. Vasan, Siva Sudani, Degang Chen, Randall L. Geiger:
Sinusoidal signal generation for production testing and BIST applications. ISCAS 2012: 2601-2604 - [c67]Chen Zhao, Randall L. Geiger, Degang Chen:
A compact low-power supply-insensitive CMOS current reference. ISCAS 2012: 2825-2828 - [c66]Zhongjun Yu, Degang Chen:
Algorithm for dramatically improved efficiency in ADC linearity test. ITC 2012: 1-10 - [c65]Siva Sudani, Degang Chen, Randy Geiger:
A method for accurate full spectrum testing without requiring coherency. MWSCAS 2012: 346-349 - [c64]Srijita Patra, Degang Chen, Randy Geiger:
Reliability modeling of metal interconnects with time-dependent electrical and thermal stress. MWSCAS 2012: 514-517 - [c63]Yen-Ting Wang, Chen Zhao, Randall L. Geiger, Degang Chen, Shu-Chuan Huang:
Performance verification of start-up circuits in reference generators. MWSCAS 2012: 518-521 - [c62]Yulong Shi, Degang Chen:
An on-chip inductive impedance measurement method with adaptive measurement range control for MWM-array based NDE applications. MWSCAS 2012: 618-621 - 2011
- [c61]Jingbo Duan, Degang Chen:
SNR measurement based on linearity test for ADC BIST. ISCAS 2011: 269-272 - [c60]Chen Zhao, Jun He, Sheng-Huang Lee, Karl Peterson, Randall L. Geiger, Degang Chen:
Linear vt-based temperature sensors with low process sensitivity and improved power supply headroom. ISCAS 2011: 2553-2556 - [c59]Siva Sudani, Minshun Wu, Degang Chen:
A novel robust and accurate spectral testing method for non-coherent sampling. ITC 2011: 1-10 - 2010
- [c58]Tao Zeng, Degang Chen:
New calibration technique for current-steering DACs. ISCAS 2010: 573-576 - [c57]Jingbo Duan, Degang Chen, Randall L. Geiger:
Phase control of triangular stimulus generator for ADC BIST. ISCAS 2010: 1935-1938 - [c56]Jun He, Degang Chen, Randall L. Geiger:
Detailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators. ISCAS 2010: 2390-2393 - [c55]Jingbo Duan, Le Jin, Degang Chen:
INL based dynamic performance estimation for ADC BIST. ISCAS 2010: 3028-3031 - [c54]Bharath K. Vasan, Randall L. Geiger, Degang Chen:
Linearity testing of ADCs using low linearity stimulus and Kalman filtering. ISCAS 2010: 3032-3035 - [c53]Tao Zeng, Degang Chen:
Output impedance linearization technique for current-steering DACs. ISCAS 2010: 3357-3360 - [c52]Jingbo Duan, Le Jin, Degang Chen:
A new method for estimating spectral performance of ADC from INL. ITC 2010: 694-703
2000 – 2009
- 2009
- [j18]Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger:
Analyses of Static and Dynamic Random Offset Voltages in Dynamic Comparators. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(5): 911-919 (2009) - [j17]Le Jin, Degang Chen, Randall L. Geiger:
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE Trans. Instrum. Meas. 58(8): 2679-2685 (2009) - [j16]Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger:
High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy. IEEE Trans. Instrum. Meas. 58(8): 2697-2705 (2009) - [c51]Bharath K. Vasan, Jingbo Duan, Chen Zhao, Randall L. Geiger, Degang Chen:
Signal generators for cost effective BIST of ADCs. ECCTD 2009: 113-116 - [c50]Jingbo Duan, Degang Chen, Randall L. Geiger:
Cost Effective Signal Generators for ADC BIST. ISCAS 2009: 13-16 - [c49]Thu T. Duong, Degang Chen, Randall L. Geiger:
Optimal Area and Impedance Allocation for Dual-string DACs. ISCAS 2009: 2741-2744 - 2008
- [j15]Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DAC Using Low-Resolution ADC With Wobbling. IEEE Trans. Instrum. Meas. 57(5): 940-946 (2008) - [c48]Hanqing Xing, Degang Chen, Randall L. Geiger:
On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering. EIT 2008: 117-122 - [c47]Vaibhav Kumar, Degang Chen:
An overview and behavioral modeling of higher order multi-bit SigmaDelta A/D converters. EIT 2008: 128-133 - [c46]Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger:
A simple and accurate method to predict offset voltage in dynamic comparators. ISCAS 2008: 1934-1937 - [c45]Vipul Katyal, Randall L. Geiger, Degang Chen:
Adjustable hysteresis CMOS Schmitt triggers. ISCAS 2008: 1938-1941 - [c44]Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin:
System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS 2008: 2402-2405 - 2007
- [j14]Chengming He, Le Jin, Degang Chen, Randy Geiger:
Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(5): 964-973 (2007) - [j13]Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger:
Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. IEEE Trans. Instrum. Meas. 56(5): 1753-1762 (2007) - [j12]Le Jin, Degang Chen, Randall L. Geiger:
SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. IEEE Trans. Instrum. Meas. 56(5): 1776-1785 (2007) - [c43]Hanjun Jiang, Degang Chen, Randall L. Geiger:
Deterministic DEM DAC Performance Analysis. ISCAS 2007: 3860-3863 - [c42]Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger:
A fully digital-compatible BIST strategy for ADC linearity testing. ITC 2007: 1-10 - [c41]Le Jin, Degang Chen, Randall L. Geiger:
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS 2007: 303-310 - 2006
- [j11]Yu Lin, Degang Chen, Randall L. Geiger:
Yield enhancement with optimal area allocation for ratio-critical analog circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 53-I(3): 534-553 (2006) - [j10]Xuezhen Wang, Degang Chen:
Output tracking control of a one-link flexible manipulator via causal inversion. IEEE Trans. Control. Syst. Technol. 14(1): 141-148 (2006) - [j9]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations. IEEE Trans. Instrum. Meas. 55(3): 902-915 (2006) - [c40]Vipul Katyal, Randall L. Geiger, Degang Chen:
A New High Precision Low Offset Dynamic Comparator for High Resolution High Speed ADCs. APCCAS 2006: 5-8 - [c39]Xin Dai, Degang Chen, Randall L. Geiger:
Explicit characterization of bandgap references. ISCAS 2006 - [c38]Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger:
A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS 2006 - [c37]Hanqing Xing, Degang Chen, Randall L. Geiger:
Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs. ISCAS 2006 - [c36]Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger:
Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS 2006 - [c35]Le Jin, Degang Chen, Randall L. Geiger:
Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. ITC 2006: 1-9 - [c34]Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC 2006: 1-10 - 2005
- [j8]Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger:
Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE Trans. Instrum. Meas. 54(3): 1188-1199 (2005) - [c33]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test. ISCAS (1) 2005: 784-787 - [c32]Zhongjun Yu, Degang Chen, Randall L. Geiger, Ioannis Papantonopoulos:
Pipeline ADC linearity testing with dramatically reduced data capture time. ISCAS (1) 2005: 792-795 - [c31]Le Jin, Degang Chen, Randall L. Geiger:
A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) 2005: 1378-1381 - [c30]Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen:
A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) 2005: 3809-3812 - [c29]Hanjun Jiang, Degang Chen, Randall L. Geiger:
Dither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACs. ISCAS (5) 2005: 4285-4288 - [c28]Hanqing Xing, Degang Chen, Randall L. Geiger:
A two-step DDEM ADC for accurate and cost-effective DAC testing. ISCAS (5) 2005: 4289-4292 - [c27]Xin Dai, Degang Chen, Randall L. Geiger:
A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs. ISCAS (5) 2005: 4831-4834 - [c26]Xin Dai, Chengming He, Hanqing Xing, Degang Chen, Randall L. Geiger:
An Nth order central symmetrical layout pattern for nonlinear gradients cancellation. ISCAS (5) 2005: 4835-4838 - [c25]Degang Chen, Zhongjun Yu, Randall L. Geiger:
An adaptive, truly background calibration method for high speed pipeline ADC design. ISCAS (6) 2005: 6190-6193 - [c24]Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen:
High-performance ADC linearity test using low-precision signals in non-stationary environments. ITC 2005: 10 - [c23]Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger:
A 16-bit resistor string DAC with full-calibration at final test. ITC 2005: 10 - 2004
- [c22]Hanjun Jiang, Haibo Fei, Degang Chen, Randall L. Geiger:
A background digital self-calibration scheme for pipelined ADCs based on transfer curve estimation. ISCAS (1) 2004: 61-64 - [c21]Chengming He, Kuangming Yap, Degang Chen, Randall L. Geiger:
NTH order circular symmetry pattern and hexagonal tesselation: two new layout techniques cancelling nonlinear gradient. ISCAS (1) 2004: 237-240 - [c20]Zhongjun Yu, Degang Chen, Randall L. Geiger:
The SRE/SRM approach for spectral testing of AMS circuits. ISCAS (1) 2004: 249-252 - [c19]Xuezhen Wang, Robert Weber, Degang Chen:
A novel 1.5 V CMFB CMOS down-conversion mixer design for IEEE 802.11 A WLAN systems. ISCAS (4) 2004: 373-376 - [c18]Chengming He, Le Jin, Degang Chen, Randall L. Geiger:
Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) 2004: 481-484 - [c17]Zhongjun Yu, Degang Chen, Randall L. Geiger:
Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations. ISCAS (1) 2004: 645-648 - [c16]Haibo Fei, Randall L. Geiger, Degang Chen:
Optimum area allocation for resistors and capacitors in continuous-time monolithic filters. ISCAS (1) 2004: 865-868 - [c15]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
Testing high resolution ADCs using deterministic dynamic element matching. ISCAS (1) 2004: 920-923 - [c14]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing. ISCAS (1) 2004: 924-927 - [c13]Le Jin, Chengming He, Degang Chen, Randall L. Geiger:
An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) 2004: 928-931 - [c12]Le Jin, Chengming He, Degang Chen, Randall L. Geiger:
Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) 2004: 932-935 - [c11]Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger:
Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs. ITC 2004: 1379-1388 - [c10]Zhongjun Yu, Degang Chen, Randall L. Geiger:
A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling. ITC 2004: 1398-1407 - 2003
- [j7]Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger:
BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003) - [c9]Chengming He, Degang Chen, Randall L. Geiger:
A low-voltage compatible two-stage amplifier with ≥120 dB gain in standard digital CMOS. ISCAS (1) 2003: 353-356 - [c8]Beatriz Olleta, Lance Juffer, Degang Chen, Randall L. Geiger:
A deterministic dynamic element matching approach to ADC testing. ISCAS (5) 2003: 533-536 - [c7]Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger:
Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. ISCAS (5) 2003: 537-540 - [c6]Zhongjun Yu, Degang Chen, Randall L. Geiger:
1-D and 2-D switching strategies achieving near optimal INL for thermometer-coded current steering DACs. ISCAS (1) 2003: 909-912 - [c5]Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger:
Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. ITC 2003: 218-227 - 2001
- [c4]Xuezhen Wang, Degang Chen:
Causal inversion of nonminimum phase systems. CDC 2001: 73-78 - [c3]Jun Che, Degang Chen:
Automatic landing control using H∞ control and stable inversion. CDC 2001: 241-246 - 2000
- [c2]Xuezhen Wang, D. J. Chen:
Adaptive learning control for nonminimum phase systems. SMC 2000: 26-31
1990 – 1999
- 1999
- [j6]Ranjan Mukherjee, Degang Chen, Gangbing Song:
Feedback control strategies for a nonholonomic mobile robot using a nonlinear oscillator. J. Field Robotics 16(4): 237-248 (1999) - 1998
- [j5]Hongchao Zhao, Degang Chen:
A finite energy property of stable inversion to nonminimum phase nonlinear systems. IEEE Trans. Autom. Control. 43(8): 1170-1174 (1998) - 1996
- [j4]Santosh Devasia, Degang Chen, Brad Paden:
Nonlinear inversion-based output tracking. IEEE Trans. Autom. Control. 41(7): 930-942 (1996) - [c1]Hongchao Zhao, Degang Chen:
Optimal motion planning for flexible space robots. ICRA 1996: 393-398 - 1993
- [j3]Tesfay Meressi, Degang Chen, Brad E. Paden:
Application of Kharitonov's theorem to mechanical systems. IEEE Trans. Autom. Control. 38(3): 488-491 (1993) - [j2]Degang Chen, Brad E. Paden:
Adaptive linearization of hybrid step motors: stability analysis. IEEE Trans. Autom. Control. 38(6): 874-887 (1993) - [j1]Ranjan Mukherjee, Degang Chen:
Control of free-flying underactuated space manipulators to equilibrium manifolds. IEEE Trans. Robotics Autom. 9(5): 561-570 (1993)
Coauthor Index
Randall L. Geiger
aka: Randy Geiger
aka: Randy Geiger
[c175] [c168] [c167] [c166] [c165] [c163] [c156] [j50] [j45] [j44] [j43] [c140] [c137] [c135] [j39] [c128] [c127] [c120] [c115] [c105] [c104] [c97] [c95] [c87] [c83] [c82] [c81] [j25] [c77] [c75] [c74] [c73] [c70] [j23] [c69] [c68] [c67] [c65] [c64] [c63] [c60] [c57] [c56] [c54] [j18] [j17] [j16] [c51] [c50] [c49] [j15] [c48] [c46] [c45] [c44] [j14] [j13] [j12] [c43] [c42] [c41] [j11] [j9] [c40] [c39] [c38] [c37] [c36] [c35] [c34] [j8] [c33] [c32] [c31] [c30] [c29] [c28] [c27] [c26] [c25] [c24] [c23] [c22] [c21] [c20] [c18] [c17] [c16] [c15] [c14] [c13] [c12] [c11] [c10] [j7] [c9] [c8] [c7] [c6] [c5]
Siva Sudani
aka: Siva Kumar Sudani
aka: Siva Kumar Sudani
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