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"Prediction of Capacitor's Accelerated Aging Based on Advanced Measurements ..."

Hao Liu et al. (2020)

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DOI: 10.1109/TIM.2020.3001368

access: closed

type: Journal Article

metadata version: 2021-05-04

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Hao Liu, Tim Claeys, Davy Pissoort, Guy A. E. Vandenbosch:
Prediction of Capacitor's Accelerated Aging Based on Advanced Measurements and Deep Neural Network Techniques. IEEE Trans. Instrum. Meas. 69(11): 9019-9027 (2020)

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