"Remaining Useful Life Prediction of SiC MOSFETs Using the Autoformer-RELM ..."

Wei Luo et al. (2025)

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DOI: 10.1109/TIM.2025.3579735

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type: Journal Article

metadata version: 2025-07-06

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Wei Luo, Yufan Liu, Yili Pan, Lin Bai:
Remaining Useful Life Prediction of SiC MOSFETs Using the Autoformer-RELM Model. IEEE Trans. Instrum. Meas. 74: 1-11 (2025)

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