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"Testing microwave devices under different source impedance values-a novel ..."

Gian Luigi Madonna et al. (2000)

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DOI: 10.1109/19.843065

access: closed

type: Journal Article

metadata version: 2020-06-08

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Gian Luigi Madonna, Andrea Ferrero, Marco Pirola, Umberto Pisani:
Testing microwave devices under different source impedance values-a novel technique for on-line measurement of source and device reflection coefficients. IEEE Trans. Instrum. Meas. 49(2): 285-289 (2000)

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