"Characterizing S-Parameters of Microwave Coaxial Devices With up to Four ..."

Manoj Stanley et al. (2024)

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DOI: 10.1109/TIM.2024.3369144

access: closed

type: Journal Article

metadata version: 2024-03-16

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Manoj Stanley, Martin J. Salter, Jonas Urbonas, James Skinner, Sang-Hee Shin, Sebastian De Graaf, Nick M. Ridler:
Characterizing S-Parameters of Microwave Coaxial Devices With up to Four Ports at Temperatures of 3 K and Above for Quantum Computing Applications. IEEE Trans. Instrum. Meas. 73: 1-6 (2024)

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