"A Digital Testing Strategy for Characterizing an Analog Circuit Block."

Hsin-Wen Ting (2016)

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DOI: 10.1109/TIM.2016.2534298

access: closed

type: Journal Article

metadata version: 2020-06-08

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Hsin-Wen Ting:
A Digital Testing Strategy for Characterizing an Analog Circuit Block. IEEE Trans. Instrum. Meas. 65(6): 1374-1384 (2016)

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