"An Automated Setup for the Characterization of Time-Based Degradation ..."

Xhesila Xhafa et al. (2021)

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DOI: 10.1109/TIM.2021.3090175

access: closed

type: Journal Article

metadata version: 2021-12-15

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Xhesila Xhafa, Ali Dogus Güngördü, Didem Erol, Yavuzhan Yavuz, Mustafa Berke Yelten:
An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors. IEEE Trans. Instrum. Meas. 70: 1-10 (2021)

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