"A Defect Inspection for Explosive Cartridge Using an Improved Visual ..."

Liang Xu et al. (2020)

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DOI: 10.1109/TIM.2019.2912237

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type: Journal Article

metadata version: 2025-01-19

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Liang Xu, Haibo Xu, Xiuxi Li, Ming Pan:
A Defect Inspection for Explosive Cartridge Using an Improved Visual Attention and Image-Weighted Eigenvalue. IEEE Trans. Instrum. Meas. 69(4): 1191-1204 (2020)

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