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"A Simultaneous Multi-Directional Defects Measurement Based on ..."

Liping Yan et al. (2023)

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DOI: 10.1109/TIM.2023.3261936

access: closed

type: Journal Article

metadata version: 2023-04-29

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Liping Yan, Lan Tan, Liu Huang, Benyong Chen:
A Simultaneous Multi-Directional Defects Measurement Based on Polarization-Multiplexed Four-Directional Digital Shearography With Large Field of View. IEEE Trans. Instrum. Meas. 72: 1-8 (2023)

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