"Large-Margin Extreme Learning Machines With Hybrid Features for Wafer Map ..."

Zhengkun Yi et al. (2024)

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DOI: 10.1109/TIM.2024.3374295

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type: Journal Article

metadata version: 2024-06-18

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Zhengkun Yi, Wanfeng Shang, Dong Wang, Meng Yin, Chunjie Chen, Wei Feng, Xinyu Wu:
Large-Margin Extreme Learning Machines With Hybrid Features for Wafer Map Defect Recognition. IEEE Trans. Instrum. Meas. 73: 1-10 (2024)

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